-40%

JEOL Inspection Stage Chamber Gate Assembly JWS-7555S Wafer Review SEM Spare

$ 533.9

Availability: 100 in stock
  • Restocking Fee: No
  • Return shipping will be paid by: Buyer
  • MPN: Wafer Chamber Gate Assembly
  • Model: CMK2-M-40-50
  • Condition: Removed from a JEOL JWS-7555S Wafer Defect Review SEM Scanning Electron Microscope System.
  • Brand: JEOL
  • Item must be returned within: 60 Days
  • Inventory #: CONF-1162
  • All returns accepted: Returns Accepted
  • Category: Semiconductor Tools Systems and Components
  • Refund will be given as: Money Back

    Description

    JEOL Inspection Stage Chamber Gate Assembly JWS-7555S Wafer Review SEM Spare
    Inventory # CONF-1162
    Part No: Wafer Chamber Gate Assembly
    Removed from a JEOL JWS-7555S Wafer Defect Review SEM Scanning Electron Microscope System
    Installed Component
    CKD Part No: CMK2-M-40-50
    This JEOL Inspection Stage Chamber Gate Assembly JWS-7555S Wafer Review SEM Spare is used working surplus. Removed from a JEOL JWS-7555S Wafer Defect Review SEM Scanning Electron Microscope System. The physical condition is good, but there are signs of previous use and handling.
    Sale Details
    Item Condition:
    Used Working, 90 Day Warranty
    Estimated Packed Shipping Dimensions:
    L x W x H = 20"x20"x20" @ 14 lbs.
    Only items pictured are included:
    If a part is not pictured, or mentioned above, then it is not included in the sale. Pictured test equipment is not included or available for sale.
    For items with multiple quantities:
    The pictured item is not necessarily the one that will be sent. Serial numbers or country of manufacture may vary.
    Items are sold with a
    90-Day Satisfaction Guarantee
    Lister 31