-40%

JEOL Wafer Stage Assembly 200mm with Probes JWS-7555S Wafer Defect SEM Working

$ 1019.64

Availability: 100 in stock
  • Return shipping will be paid by: Buyer
  • Brand: JEOL
  • Inventory #: CONF-1299
  • All returns accepted: Returns Accepted
  • Category: Semiconductor Tools Systems and Components
  • Restocking Fee: No
  • MPN: Wafer Stage Assembly
  • Condition: The filaments are bent (see photos)
  • Item must be returned within: 60 Days
  • Refund will be given as: Money Back

    Description

    JEOL Wafer Stage Assembly 200mm with Probes JWS-7555S Wafer Defect SEM Working
    Inventory # CONF-1299
    Part No: Wafer Stage Assembly
    Removed from a JEOL JWS-7555S Wafer Defect Review SEM Scanning Electron Microscope System
    This JEOL Wafer Stage Assembly 200mm JWS-7555S Wafer Defect Review SEM is used working surplus. The filaments are bent (see photos). The physical condition is good, but there are signs of previous use and handling.
    Sale Details
    Item Condition:
    Used Working, 90 Day Warranty
    Estimated Packed Shipping Dimensions:
    L x W x H = 19"x39"x22" @ 250 lbs.; Requires Freight Shipping
    Only items pictured are included:
    If a part is not pictured, or mentioned above, then it is not included in the sale. Pictured test equipment is not included or available for sale.
    For items with multiple quantities:
    The pictured item is not necessarily the one that will be sent. Serial numbers or country of manufacture may vary.
    Items are sold with a
    90-Day Satisfaction Guarantee
    Lister 31